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[黄昆论坛]第342期:Cost-Effective Techniques for Analog Design, Analog Fault Coverage, and Fast and Accurate Testing of High Resolution ADCs

2019-05-31

报告题目:Cost-Effective Techniques for Analog Design, Analog Fault Coverage, and Fast and Accurate Testing of High Resolution ADCs

报告人:Prof. Degang Chen (IEEE Fellow, Junkins Chair Professor of Electrical and Computer Engineering, Iowa State University, USA)

报告时间:2019年6月11日(星期二) 上午10:00

报告地点:中国科学院半导体研究所2号楼303A会议室



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